CSIRO PUBLISHING | Australian Journal of Physics

PH880101Advances in Synchrotron X-ray Polycrystalline Diffraction

William Parrish

pp. 101-112

PH880101 Abstract | PH880101PDF (4.9 MB)

PH880113The Rietveld Method ? A Historical Perspective

HM Rietveld

pp. 113-116

PH880113 Abstract | PH880113PDF (1015 KB)

PH880117Acquisition of Powder Diffraction Data with Synchrotron Radiation

DE Cox, BH Toby and MM Eddy

pp. 117-132

PH880117 Abstract | PH880117PDF (4 MB)

PH880133Powder Diffractometry at the Tsukuba Photon Factory

R Uno, H Ozawa, T Yamanaka, H Morikawa, M Ando, K Ohsumi, A Nukui, K Yukino and T Kawasaki

pp. 133-144

PH880133 Abstract | PH880133PDF (2.8 MB)

PH880145Profile Data Acquisition for the JCPDS?ICDD Database

Ron Jenkins

pp. 145-154

PH880145 Abstract | PH880145PDF (2.2 MB)

PH880155Investigation of the Structural and Magnetic Properties of the Light Rare Earth Elements and Their Intermetallic Compounds

DC Creagh

pp. 155-172

PH880155 Abstract | PH880155PDF (4.6 MB)

PH880173Profile Analysis for Microcrystalline Properties by the Fourier and Other Methods

JI Langford, R Delhez, ThH de Keijser and EJ Mittemeijer

pp. 173-188

PH880173 Abstract | PH880173PDF (3.9 MB)

PH880189Generalised Least-squares Determination of Triaxial Stress States by X-ray Diffraction and the Associated Errors

RA Winholtz and JB Cohen

pp. 189-200

PH880189 Abstract | PH880189PDF (2.8 MB)

PH880201Precision Peak Determination in X-ray Powder Diffraction

TC Huang

pp. 201-212

PH880201 Abstract | PH880201PDF (3.1 MB)

PH880213Size and Strain Parameters from Peak Profiles: Sense and Nonsense

R Delhez, ThR de Keijser, EJ Mittemeijer and JI Langford

pp. 213-228

PH880213 Abstract | PH880213PDF (4.1 MB)

PH880229Learned Peak Shape Functions for Powder Diffraction Data

A Hepp and Ch Baerlocher

pp. 229-236

PH880229 Abstract | PH880229PDF (2.1 MB)

PH880237Pitfalls in the Evaluation of X-ray Diffraction Line Shape

Gerhard Zorn

pp. 237-250

PH880237 Abstract | PH880237PDF (3.3 MB)

PH880251X-ray Line Broadening Study on Shock-modified Zirconia

B Morosin, RA Graham, Y Zhang, JM Stewart and CR Hubbard

pp. 251-260

PH880251 Abstract | PH880251PDF (2.4 MB)

PH880261Structure and Properties of Surface Layers: X-ray Diffraction Studies

R Delhez, ThH de Keijser, EJ Mittemeijer, BJ Thijsse, MA Hollanders, OB Loopstra and WG Sloof

pp. 261-282

PH880261 Abstract | PH880261PDF (5.6 MB)

PH880283Crystal Structure Analysis and Refinement Using Integrated Intensities from Accurate Profile Fits

G Will

pp. 283-296

PH880283 Abstract | PH880283PDF (3.6 MB)

PH880297Pressing the Limits of Rietveld Refinement

RA Young

pp. 297-310

PH880297 Abstract | PH880297PDF (3.3 MB)

PH880311Use of Full Diffraction Spectra, Both Experimental and Calculated, in Quantitative Powder Diffraction Analysis

Deane K Smith, Gerald G Johnson Jr and Andrew M Wims

pp. 311-322

PH880311 Abstract | PH880311PDF (2.7 MB)

PH880323Quantitative Analysis of Phases in Zeolite Bearing Rocks from Full X-ray Diffraction Profiles

JC Taylor and SR Pecover

pp. 323-336

PH880323 Abstract | PH880323PDF (3.3 MB)