Accurate Measurement of Powder Diffraction Intensities Using Synchrotron Radiation

Abstract

This paper reviews the advantages of synchrotron radiation for obtaining accurate values of the integrated intensities of powder samples for crystal structure refinement. The higher accuracy than conventional X-ray tube focusing methods results from the parallel beam geometry which has a symmetrical constant instrument function, higher intensity and resolution and easy wavelength selectivity. The importance of specimen preparation and the profile fitting function are discussed.