Generation of conductivity-depth pseudo-sections from coincident loop and in-loop TEM data

Abstract

A computationally-efficient transformation has been developed to convert coincident loop or in-loop TEM profiles to apparent conductivity versus depth pseudo-sections. The transformation is based on the depth to the maximum physical current induced in a half-space, not on attributes of abstract current filaments. Tests on both synthetic and field data indicate that these pseudo-sections provide a useful qualitative portrayal of conductivity structure, thus facilitating first-pass interpretation of TEM in mapping applications.