The statistical analysis of quality traits in plant improvement programs with application to the mapping of milling yield in wheat

Abstract

It is well known that the response to selection for grain yield is improved with the use of appropriate experimental designs and statistical analyses. The issues are more complex for quality traits since the data are obtained from a 2-phase process in which samples are collected from the field then processed in the laboratory. This paper presents a method of analysis for quality trait data that allows for variation arising from both the field and laboratory phases. Initially, an analysis suitable for standard varietal selection is presented. This is extended to include molecular genetic marker information for the purpose of detecting quantitative trait loci. The technique is illustrated using two doubled haploid wheat (Triticum aestivum L.) populations in which the trait of interest is milling yield.