
TY  - JOUR
A1  - Hugman, J. 
A1  - Richards, B. S. 
A1  - Crosky, A. 
T1  - Phase characterisation of TiO<sub>2</sub> thin films using micro-Raman spectroscopy and glancing angle x-ray diffraction
JF  - Science Access
JO  - 
Y1  - 2004
VL  - 2
IS  - 1
SP  - 204
EP  - 205
KW  - 
UR  - https://doi.org/10.1071/SA0402087 
ER  -

