
%0 Journal Article
%A Hugman, J. 
%A Richards, B. S. 
%A Crosky, A. 
%T Phase characterisation of TiO<sub>2</sub> thin films using micro-Raman spectroscopy and glancing angle x-ray diffraction
%J Science Access
%D 2004/06/01
%V 2
%N 1
%P 204-205
%K 
%R https://doi.org/10.1071/SA0402087
%U https://www.publish.csiro.au/paper/SA0402087 
