
%0 Journal Article
%A Rossouw, CJ 
%A Maher, FJ 
%A Panjkov, AA 
%T A Fast-response EBIC System
%J Australian Journal of Physics
%D 1983/08/01
%V 36
%N 4
%P 565-572
%K 
%R https://doi.org/10.1071/PH830565
%U https://www.publish.csiro.au/paper/PH830565 
%X The application of the EBIC technique in the study of electrical activity of defects in semiconductors is discussed, with particular reference to instrumentation. A fast-response current amplifier, built in our Division, is shown to be more than adequate for most EBIC applications. Some examples of EBIC analysis are presented. 
