
%0 Journal Article
%A Crompton, RW 
%A Haddad, GN 
%T Thermal Electron Attachment to SF<sub>6</sub> and CFCl<sub>3</sub>
%J Australian Journal of Physics
%D 1983/02/01
%V 36
%N 1
%P 15-26
%K 
%R https://doi.org/10.1071/PH830015
%U https://www.publish.csiro.au/paper/PH830015 
%X Measurements of the attachment rate for thermal electrons to SF6 and CFCI3 have been made using the Cavalieri electron-density sampling technique. The largest single source of error was shown to be uncertainty in the composition of the gas mixtures used in the experiments which contained < 10 ppm of the attaching gases. By paying special attention to this problem, the overall uncertainty in the attachment rates was reduced to less than ± 3 %. 
