
TY  - JOUR
A1  - White, John W. 
A1  - Brown, Anthony S. 
A1  - Holt, Stephen A. 
A1  - Saville, Paul M. 
T1  - Neutron and X-ray Reflectometry: Solid Multilayers and Crumpling Films
JF  - Australian Journal of Physics
JO  - Aust. J.  Phys.
Y1  - 1997
VL  - 50
IS  - 2
SP  - 391
EP  - 405
KW  - 
UR  - https://doi.org/10.1071/P96021 
N2  - The structures of films and interfaces at the molecular level can be determined from specular reflectivity measurements using neutrons and X-rays. A general introduction to the principles of neutron and X-ray reflectometry is given. Illustrative examples of the application of neutron and X-ray reflectometry to problems of chemical and physical interest are presented. 
ER  -

