Structural Characterization of Nickel(II) Tetraphenylporphyrin
AL Maclean, GJ Foran, BJ Kennedy, P Turner and TW Hambley
Australian Journal of Chemistry
49(12) 1273 - 1278
Published: 1996
Abstract
The structure of 5,10,15,20-tetraphenylporphinatonickel(II) ([Ni( tpp )]) has been studied by both X-ray diffraction (powder and single-crystal methods) and EXAFS. The bond lengths obtained from analysis of the EXAFS agree, within standard deviations, with those obtained from the X-ray diffraction studies. The Ni-N bond length of 1.93(1) Ǻ agrees especially well with the value of 1.931(2) Ǻ obtained from the single-crystal analysis. The powder X-ray diffraction pattern, collected by using synchrotron radiation, is presented.
https://doi.org/10.1071/CH9961273
© CSIRO 1996