A Combined Voltammetric and Synchrotron Radiation-Grazing Incidence X-ray Diffraction Study of the Electrocrystallization of Zinc Tetracyanoquinodimethane
Jean-Pierre Veder A B , Ayman Nafady D , Graeme Clarke A , Roland De Marco A C E and Alan M. Bond DA Nanochemistry Research Institute, Department of Chemistry, Curtin University, GPO Box U1987, Perth, WA 6845, Australia.
B Present Address: CSIRO Process Science and Engineering, Box 312, Clayton South, Vic. 3169, Australia.
C Present Address: Faculty of Science, University of the Sunshine Coast, Maroochydore D.C., Qld 4558, Australia.
D School of Chemistry, Monash University, Clayton, Vic. 3800, Australia.
E Corresponding author. Email: rdemarc1@usc.edu.au
Australian Journal of Chemistry 65(3) 236-240 https://doi.org/10.1071/CH11361
Submitted: 8 September 2011 Accepted: 6 February 2012 Published: 21 March 2012
Abstract
The in situ electrocrystallization of zinc tetracyanoquinodimethane (TCNQ) has been explored using synchrotron radiation-grazing incidence X-ray diffraction (SR-GIXRD) at potentials in the region of the cyclic voltammetric peak where reduction of TCNQ to TCNQ– occurs at a Pt electrode in acetonitrile (0.1 M [NBu4][PF6]) solution containing Zn(NO3)2·6H2O. The in situ SR-GIXRD data along with ex situ IR and Raman spectroscopy results all confirmed the formation of the kinetically favoured phase of Zn[TCNQ]2(H2O)2 as the product.
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