A New Method of Wavelength Calibration for LAMOST by Combining Short- and Long-Exposure Spectral Lines
G. H. Ye A , J. Zhu A and Z. F. Ye A BA Institute of Statistical Signal Processing, Department of Electronic Engineering and Information Science, University of Science and Technology of China, Hefei 230027, P. R. China
B Corresponding author. Email: yezf@ustc.edu.cn
Publications of the Astronomical Society of Australia 29(1) 66-71 https://doi.org/10.1071/AS11047
Submitted: 13 September 2011 Accepted: 11 December 2011 Published: 16 January 2012
Abstract
In wavelength calibration using arc lines, the normal approach is to use the strongest unsaturated lines, leaving weak lines unused. A new method is proposed in this paper, which not only utilizes the strong spectral lines, but also makes most use of weak spectral lines. In order to validate the effectiveness of the method we propose, experiments are performed on simulated spectra. Firstly, two kinds of spectra are generated: one with a short exposure and another with a long exposure. Secondly, calibration lines are chosen from the short exposure and long exposure spectra separately according to some rules. Thirdly, the initial wavelength calibration is completed by using the selected short-exposure lines. Fourthly, the approximate centroids of the selected long-exposure lines are obtained by utilizing the result of the initial wavelength calibration. These are then adjusted iteratively to obtain the centroids. Finally, the selected lines from the short- and long-exposures are combined to obtain the final wavelength calibration. Compared with traditional calibration methods which only use short exposures and strong lines, the proposed method is shown to be more accurate.
Keywords: instrumentation: spectrographs — methods: data analysis — techniques: spectroscopic — lines: identification
References
Bai, L., Liao, N. F., Li, Z. J. and Yang, W. P., 2004, ChOpL, 2, 174Balona, L. A., 2010, MNRAS, 409, 1601
| Crossref | GoogleScholarGoogle Scholar |
Burles, S., Finkbeiner, D. & Schlegel, D., 2008, available at http://das.sdss.org/software/idlspec2d/v5 3 12/pro/spec2d/
Lo, E. and Fountain,, A. W., 2006, SPIE, 6233, 62330L
| Crossref | GoogleScholarGoogle Scholar |
Qin, H. Q., Zhu, J., Zhu, Z. Q., Ye, Z. F. and Luo, A. L., 2010, PASA, 27, 265
| Crossref | GoogleScholarGoogle Scholar |
Sanchez, S. F., 2006, AN, 327, 850
Su, D. Q., Cui, Y. Q., Wang, Y. N. and Yao, Z. Y., 1998, SPIE, 3352, 76
| Crossref | GoogleScholarGoogle Scholar |
Van Geffen, J. H. G. M. and Van Oss, R. F., 2003, ApOpt, 42, 2739
| Crossref | GoogleScholarGoogle Scholar |
Wang, S., Qin, H. Q. and Ye, Z. F., 2010, EA, 28, 195
Xue, X. L. and Ye, Z. F., 2009, AR&T, 6, 181
Zhu, Y. T., Hu, Z. W., Zhang, Q. F., Wang, L. and Wang, J. N., 2006, SPIE, 6269, 62690M
| Crossref | GoogleScholarGoogle Scholar |