
TY  - JOUR
A1  - Islam, F. M. A. 
A1  - Basford, K. E. 
A1  - Redden, R. J. 
A1  - Jara, C. 
A1  - Beebe, S. 
T1  - Patterns of resistance to angular leaf spot, anthracnose and common bacterial blight in common bean germplasm
JF  - Australian Journal of Experimental Agriculture
JO  - Aust. J. Exp. Agric.
Y1  - 2002
VL  - 42
IS  - 4
SP  - 481
EP  - 490
KW  - CIAT, disease resistance, pattern analysis.
UR  - https://doi.org/10.1071/EA01035 
N2  - Diseases and insect pests are major causes of low yields of common bean (Phaseolus vulgaris L.) in Latin America and Africa. Anthracnose, angular leaf spot and common bacterial blight are widespread foliar diseases of common bean that also infect pods and seeds. One thousand and eighty-two accessions from a common bean core collection from the primary centres of origin were investigated for reaction to these three diseases. Angular leaf spot and common bacterial blight were evaluated in the field at Santander de Quilichao, Colombia, and anthracnose was evaluated in a screenhouse in Popayán, Colombia. By using the 15-group level from a hierarchical clustering procedure, it was found that 7 groups were formed with mainly Andean common bean accessions (Andean gene pool), 7 groups with mainly Middle American accessions (Middle American gene pool), while 1 group contained mixed accessions. Consistent with the theory of co-evolution, it was generally observed that accessions from the Andean gene pool were resistant to Middle American pathogen isolates causing anthracnoxe, while the Middle American accessions were resistant to pathogen isolates from the Andes. Different combinations of resistance patterns were found, and breeders can use this information to select a specific group of accessions on the basis of their need. 
ER  -

