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Australian Journal of Physics

Australian Journal of Physics

Volume 41 Number 3 1988

PH880337Accurate Charge Density-Pendellosung Methods

Norio Kato

pp. 337-350

PH880337 Abstract | PH880337PDF (3 MB)

PH880351Validity of the Structure Factor Formalism

Jimpei Harada

pp. 351-358

PH880351 Abstract | PH880351PDF (1.7 MB)

PH880359Structure Factor Determination in Surface X-ray Diffraction

LK Robinson

pp. 359-368

PH880359 Abstract | PH880359PDF (2.1 MB)

PH880369The Anharmonic Temperature Factor in Crystallographic Structure Analysis

WF Kuhs

pp. 369-382

PH880369 Abstract | PH880369PDF (3.3 MB)

PH880383Use of Extinction Corrections in Neutron Diffraction Experiments

A Delapalme

pp. 383-392

PH880383 Abstract | PH880383PDF (2 MB)

PH880393Concerning Single Crystal Reflectivity Curves

A McL Mathieson

pp. 393-402

PH880393 Abstract | PH880393PDF (2.3 MB)

PH880403Accurate Measurement of Powder Diffraction Intensities Using Synchrotron Radiation

W Parrish and M Hart

pp. 403-412

PH880403 Abstract | PH880403PDF (2.1 MB)

PH880413Accurate Structure Factor Measurements by Powder Methods

TM Sabine

pp. 413-422

PH880413 Abstract | PH880413PDF (1.8 MB)

PH880423Redetermination of Absolute Structure Factors for Silicon at Room and Liquid Nitrogen Temperatures

S Cummings and M Hart

pp. 423-432

PH880423 Abstract | PH880423PDF (1.9 MB)

PH880433Accurate Determination of Structure Factors by Pendellosung Methods Using White Radiation

T Takama and S Sato

pp. 433-448

PH880433 Abstract | PH880433PDF (3.9 MB)

PH880449Non-systematic Three-beam Effects in Dynamical Electron Diffraction and Their Use in Determination of Amplitude and Phase of Structure Factors

K Marthinsen, H Matsuhata, R Hfier and J Gjfnnes

pp. 449-460

PH880449 Abstract | PH880449PDF (2.7 MB)

PH880461A Summary of Low-angle X-ray Atomic Scattering Factors Measured by the Critical Voltage Effect in High Energy Electron Diffraction

AG Fox and RM Fisher

pp. 461-468

PH880461 Abstract | PH880461PDF (1.8 MB)

PH880469Simple Method for Estimating the Contribution of Neighbouring n-beam Interactions to Two-beam Structure Factors

HJ Juretschke and HK Wagenfeld

pp. 469-476

PH880469 Abstract | PH880469PDF (1.7 MB)

PH880477Measurement of Thermal Diffuse Scattering Using Pulsed Neutron Diffraction

BTM Willis

pp. 477-488

PH880477 Abstract | PH880477PDF (2 MB)

PH880487Recent Advances in the Calculation and Measurement of the X-ray Dispersion Corrections

DC Creagh

pp. 487-502

PH880487 Abstract | PH880487PDF (3.4 MB)

PH880503Experimental Determination of Scan-truncation Losses from Low-temperature (16 K) Single-crystal X-ray Measurements

Riccardo Destro

pp. 503-510

PH880503 Abstract | PH880503PDF (2 MB)

PH880511Effect of n-beam Interaction

A Okazaki, H Ohe and Y Soejima

pp. 511-518

PH880511 Abstract | PH880511PDF (1.5 MB)

PH880519Determination of Structure Factors by the Pendellosung Effect for Imperfect Crystals

NM Olekhnovich

pp. 519-524

PH880519 Abstract | PH880519PDF (1.1 MB)