The Reconstruction of Displacement Fields of Defects in Crystals from Electron Micrographs

Abstract

It is shown that the theorem of Part I, namely, that there is a unique reversible connection between displacement fields and electron micrographs for the case of two-beam diffraction and analytic displacement fields, can be extended to many-beam diffraction conditions. The case of a systematic set of diffracting vectors is parallel to the two-beam case with a unique reversible connection between one component of the displacement field and one micrograph. In the general many-beam case there is a unique reversible connection between the vector displacement field and three micrographs.