Citation

Skurdal G. H. , Pfaffhuber A. A. , Davis A. , Bazin S. , Anschütz H. , Nyboe N. S. , Foged N. , Thomassen T. Wiig T. (2018) Stretching AEM near-surface resolution limits related to low- and very high resistivity contrasts. ASEG Extended Abstracts 2018, 1-5.

https://doi.org/10.1071/ASEG2018abW8_4G