Citation
Lyons LE Riemer W (1972) Oxidation-induced electromigration failure of thin films of aluminium. Australian Journal of Chemistry 25, 2069-2075.
https://doi.org/10.1071/CH9722069
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Lyons LE Riemer W (1972) Oxidation-induced electromigration failure of thin films of aluminium. Australian Journal of Chemistry 25, 2069-2075.
https://doi.org/10.1071/CH9722069
Download the article reference in the following formats: